Bayesian control charts based on predictive distributions
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Van Zyl, Ruaan
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University of the Free State
Abstract
Showing abstract in English
English: Control charts are statistical process control (SPC) tools that are widely used in
the monitoring of processes, specifically taking into account stability and dispersion.
Control charts signal when a significant change in the process being studied
is observed. This signal can then be investigated to identify issues and to find solutions.
It is generally accepted that SPC are implemented in two phases, Phase
I and Phase II. In Phase I the primary interest is assessing process stability, often
trying to bring the process in control by locating and eliminating any assignable
causes, estimating any unknown parameters and setting up the control charts. After
that the process move on to Phase II where the control limits obtained in Phase
I are used for online process monitoring based on new samples of data. This thesis
concentrate mainly on implementing a Bayesian approach to monitoring processes
using SPC. This is done by providing an overview of some non-informative priors
and then to specifically derive the reference and probability-matching priors for the
common coefficient of variation, standardized mean and tolerance limits for a normal
population. Using the Bayesian approach described in this thesis SPC is performed,
including derivations of control limits in Phase I and monitoring by the use of runlengths
and average run-lengths in Phase II for the common coefficient of variation,
standardized mean, variance and generalized variance, tolerance limits for normal
populations, two-parameter exponential distribution, piecewise exponential model
and capability indices. Results obtained using the Bayesian approach are compared
to frequentist results.