Now showing items 1-4 of 4
Simulating ion sputtered depth profiles in Auger electron spectroscopy
(University of the Free State, 2004-05)
Recent developments in advanced materials technology are mainly based on the progress in surface and interface science. These surface and interface properties of materials greatly affect and control the overall properties ...
Luminescence investigations of CaS:Eu2+ powder and pulsed laser deposited thin films for application in light emitting diodes
(University of the Free State, 2015-06)
The main objective of this thesis was to investigate the luminescent properties of commercial CaS:Eu2+ powder and pulsed laser deposited thin films for application in light emitting diodes. X-ray diffraction (XRD), X-ray ...
A theoretical and experimental investigation on the effect that slow heating and cooling has on the inter-diffusion parameters of Cu/Ni thin films
(University of the Free State, 2010)
Thin film diffusion studies often involve a surface sensitive analysis technique combined with ion erosion to produce a depth profile of a sample. Such studies compare the depth profile of a reference sample to the depth ...
Characterization of SrAl₂O₄:Eu²⁺,Dy³⁺ nano thin films prepared by pulsed laser deposition
(University of the Free State, 2010-11)
English: Thin films of SrAl2O4:Eu2+,Dy3+ phosphor were deposited on silicon (Si (100)) substrates using a 248 nm KrF pulsed laser. Deposition parameters, namely; substrate temperature, pulse repetition rate, number of laser ...