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Characterization of SrAl₂O₄:Eu²⁺,Dy³⁺ nano thin films prepared by pulsed laser deposition
(University of the Free State, 2010-11)
English: Thin films of SrAl2O4:Eu2+,Dy3+ phosphor were deposited on silicon (Si (100)) substrates using a 248 nm KrF pulsed laser. Deposition parameters, namely; substrate temperature, pulse repetition rate, number of laser ...